13 results
Preferred orientations and anisotropy in shales: Callovo-Oxfordian shale (France) and Opalinus Clay (Switzerland)
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- Journal:
- Clays and Clay Minerals / Volume 56 / Issue 3 / June 2008
- Published online by Cambridge University Press:
- 01 January 2024, pp. 285-306
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Preferred Orientation Patterns of Phyllosilicates in Surface Clays
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- Clays and Clay Minerals / Volume 65 / Issue 5 / October 2017
- Published online by Cambridge University Press:
- 01 January 2024, pp. 329-341
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D040 Routine Texture Analysis of Neutron TOF Data Using the Rietveld Method
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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Preface
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- Book:
- Minerals
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- 25 September 2020
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- 04 January 2016, pp xiii-xvi
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Electron Backscatter Diffraction (EBSD) Characterization of Uranium and Uranium Alloys
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 432-433
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- July 2012
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Rietveld texture analysis from TOF neutron diffraction data
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- Powder Diffraction / Volume 25 / Issue 3 / September 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 283-296
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Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 314-315
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- August 2005
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Decontamination of Injured Persons after Chemical Incidents: Fundamentals and Frontiers
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- Prehospital and Disaster Medicine / Volume 17 / Issue S2 / December 2002
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- 28 June 2012, p. S59
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- December 2002
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Texture Analysis of Earth Materials. Comparison of EBSD With Other Diffraction Techniques
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 228-229
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- August 1999
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3-D Imaging of Crystals at Atomic Resolution
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- MRS Online Proceedings Library Archive / Volume 332 / 1994
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- 21 February 2011, 563
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- 1994
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Textures of laser ablated superconducting thin films of YBa2Cu3O7−δ as a function of deposition temperature
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- Journal of Materials Research / Volume 7 / Issue 3 / March 1992
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- 31 January 2011, pp. 549-557
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- March 1992
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Lpcvd Polycrystalline Silicon Thin Films: The Evolution of Structure, Texture and Stress
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- MRS Online Proceedings Library Archive / Volume 202 / 1990
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- 25 February 2011, 167
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- 1990
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